{"id":3110,"date":"2023-12-27T11:51:21","date_gmt":"2023-12-27T11:51:21","guid":{"rendered":"https:\/\/nvis.scientech.co.in\/?post_type=product&#038;p=3110"},"modified":"2026-01-29T15:27:32","modified_gmt":"2026-01-29T09:57:32","slug":"band-gap-measurement-four-probe-method","status":"publish","type":"product","link":"https:\/\/nvis.scientech.co.in\/?product=band-gap-measurement-four-probe-method","title":{"rendered":"Band Gap Measurement (Four Probe Method)"},"content":{"rendered":"<p>Nvis 6105 Resistivity and Band Gap Measurement of Semiconductor is a versatile and useful training system for Physics and basic Electronics laboratories. In Nvis 6105, Band Gap can be measured by using Four Probe method.<\/p>\n<p>This is one of the most widely used method for measuring the Resistivity and Band Gap of semiconductors in which a collinear four-probe arrangement has been used. In this system, we provide pressure contacts with sample to take quick measurement at different positions. The setup is equipped with microcontroller based display for simultaneous measurement of voltage, current and temperature. Computer interfacing helps in automatic calculations and analysis.<\/p>\n<p>Product Features<\/p>\n<ul>\n<li>A complete setup for measuring the Resistivity and Band Gap<\/li>\n<li>Four individually spring loaded probe arrangement<\/li>\n<li>Collinear and equally spaced probes<\/li>\n<li>LCD Display<\/li>\n<li>Probes are mounted on a Teflon bush, which ensure a good electrical insulation<\/li>\n<li>PC Interfacing using USB\/RS232 ports and supporting software<\/li>\n<li>Sample-Germanium crystal<\/li>\n<\/ul>\n","protected":false},"excerpt":{"rendered":"<p>Nvis 6105 Resistivity and Band Gap Measurement of Semiconductor is a versatile and useful training system for Physics and basic Electronics laboratories. In Nvis 6105, Band Gap can be measured by using Four Probe method. This is one of the most widely used method for measuring the Resistivity and Band Gap of semiconductors in which [&hellip;]<\/p>\n","protected":false},"featured_media":512,"template":"","meta":{"_acf_changed":false,"_monsterinsights_skip_tracking":false,"_monsterinsights_sitenote_active":false,"_monsterinsights_sitenote_note":"","_monsterinsights_sitenote_category":0},"product_cat":[363],"product_tag":[],"class_list":["post-3110","product","type-product","status-publish","has-post-thumbnail","product_cat-physics","first","instock","shipping-taxable","product-type-simple"],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v22.3 - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>Buy Band Gap Measurement Kit (Four Probe Method)<\/title>\n<meta name=\"description\" content=\"Band gap measurement using four probe method for semiconductor analysis, material characterization, and physics laboratory use | Nevistech\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/nvis.scientech.co.in\/product\/band-gap-measurement-four-probe-method\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Buy Band Gap Measurement Kit (Four Probe Method)\" \/>\n<meta property=\"og:description\" content=\"Band gap measurement using four probe method for semiconductor analysis, material characterization, and physics laboratory use | Nevistech\" \/>\n<meta property=\"og:url\" content=\"https:\/\/nvis.scientech.co.in\/product\/band-gap-measurement-four-probe-method\/\" \/>\n<meta property=\"og:site_name\" content=\"Nvis\" \/>\n<meta property=\"article:modified_time\" content=\"2026-01-29T09:57:32+00:00\" \/>\n<meta property=\"og:image\" content=\"http:\/\/nvis.scientech.co.in\/wp-content\/uploads\/2023\/12\/band-gap-measurement-four-probe-method-nvis-6105-1.jpg\" \/>\n\t<meta property=\"og:image:width\" content=\"500\" \/>\n\t<meta property=\"og:image:height\" content=\"320\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/jpeg\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data1\" content=\"1 minute\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\/\/nvis.scientech.co.in\/product\/band-gap-measurement-four-probe-method\/\",\"url\":\"https:\/\/nvis.scientech.co.in\/product\/band-gap-measurement-four-probe-method\/\",\"name\":\"Buy Band Gap Measurement Kit (Four Probe Method)\",\"isPartOf\":{\"@id\":\"https:\/\/nvis.scientech.co.in\/#website\"},\"primaryImageOfPage\":{\"@id\":\"https:\/\/nvis.scientech.co.in\/product\/band-gap-measurement-four-probe-method\/#primaryimage\"},\"image\":{\"@id\":\"https:\/\/nvis.scientech.co.in\/product\/band-gap-measurement-four-probe-method\/#primaryimage\"},\"thumbnailUrl\":\"https:\/\/nvis.scientech.co.in\/wp-content\/uploads\/2023\/12\/band-gap-measurement-four-probe-method-nvis-6105-1.jpg\",\"datePublished\":\"2023-12-27T11:51:21+00:00\",\"dateModified\":\"2026-01-29T09:57:32+00:00\",\"description\":\"Band gap measurement using four probe method for semiconductor analysis, material characterization, and physics laboratory use | Nevistech\",\"breadcrumb\":{\"@id\":\"https:\/\/nvis.scientech.co.in\/product\/band-gap-measurement-four-probe-method\/#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\/\/nvis.scientech.co.in\/product\/band-gap-measurement-four-probe-method\/\"]}]},{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\/\/nvis.scientech.co.in\/product\/band-gap-measurement-four-probe-method\/#primaryimage\",\"url\":\"https:\/\/nvis.scientech.co.in\/wp-content\/uploads\/2023\/12\/band-gap-measurement-four-probe-method-nvis-6105-1.jpg\",\"contentUrl\":\"https:\/\/nvis.scientech.co.in\/wp-content\/uploads\/2023\/12\/band-gap-measurement-four-probe-method-nvis-6105-1.jpg\",\"width\":500,\"height\":320},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\/\/nvis.scientech.co.in\/product\/band-gap-measurement-four-probe-method\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\/\/nvis.scientech.co.in\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Products\",\"item\":\"https:\/\/nvis.scientech.co.in\/shop\/\"},{\"@type\":\"ListItem\",\"position\":3,\"name\":\"Band Gap Measurement (Four Probe Method)\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\/\/nvis.scientech.co.in\/#website\",\"url\":\"https:\/\/nvis.scientech.co.in\/\",\"name\":\"Nvis Technologies Pvt. 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